Thin multi-layer circuit board having a remodeling pad layer and a metallic barrier layer with an exclusion zone

ABSTRACT

A thin multi-layer circuit board having alternately stacked wiring pattern layers, including a top wiring pattern layer and insulating layers on an insulating plate-like substrate. The wiring pattern layers are electronically connected through vias in the insulating layers to form a predetermined circuit pattern by said wiring pattern layers. A metallic barrier layer is formed on the top wiring pattern layer, except at an exclusion zone of the metallic barrier layer. An electronic part-mounting pad layer and a remodeling pad layer are formed on the metallic barrier layer. The remodeling pad layer is arranged adjacent the electronic part-mounting pad layer, with the exclusion zone therebetween.

This application is a division of application Ser. No. 08/359,448, filedDec. 20, 1994, now issued, U.S. Pat. No. 5,679,268.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a process for fabricating a thinmulti-layer circuit board on which can be mounted many electronic partssuch as integrated circuits (ICs) and large size integrated circuits(LSIs).

2. Related Art

There has been known a thin multi-layer circuit board which is obtainedby forming an insulating layer on a plate-like substrate made of asuitable insulating material and interposing at least two wiring patternlayers in this insulating layer. The two wiring pattern layers areconnected to each other at a suitable place through a via and the twowiring pattern layers constitute a predetermined circuit pattern.Moreover, on the surface of the thin multi-layer circuit board areprovided electronic part-mounting pads to which can be connected theleads of electronic parts, the electronic part-mounting pads beingconnected through vias to the wiring pattern layers in the insulatinglayer.

SUMMARY OF THE INVENTION

An object of the present invention is to provide a thin multi-layercircuit board which is so constituted that, when a remodeling pad isbeing used, this remodeling pad can be easily cut, and a process forfabricating the same.

Another object of the present invention is to provide a process forfabricating a thin multi-layer circuit board, which does not require aprocess for etching gold plating at the time of forming a pad by platinggold on the thin multi-layer circuit board.

A further object of the present invention is to provide a process forfabricating a thin multi-layer circuit board which is capable of forminga thin chromium film on the wiring pattern layers without relying uponthe lift-off method when a number of wiring pattern layers are stackedon an insulating plate-like substrate.

A still further object of the present invention is to provide a processfor fabricating a thin multi-layer circuit board which is capable ofremoving a defective wiring pattern layer without damaging the wiringpattern layers on the lower side when a number of wiring patterns arestacked on an insulating plate-like substrate.

A yet further object of the present invention is to provide a method ofpre-baking a photosensitive polyimide resin layer that is applied in thefabrication of a multi-layer circuit board, the pre-baking method makingit possible not only to uniformly heat the insulating plate-likesubstrate from the back side thereof but also to carry out the operationwith excellent efficiency, as well as to provide a heat-accumulatingblock used for the method of pre-baking.

According to a first aspect of the present invention, there is provideda process for fabricating thin multi-layer circuit boards by alternatelystacking wiring pattern layers and insulating layers on an insulatingplate-like substrate, and electrically connecting said wiring patternlayers through vias in said insulating layers in order to construct apredetermined circuit pattern using said wiring pattern layers, whereina barrier metal exclusion zone is prepared by forming a metallic barrierlayer on said wiring pattern layer in an electronic part-mountingregion, a remodeling pad layer is formed on said metallic barrier layerneighboring said barrier metal exclusion zone, and an electronicpart-mounting pad layer is formed at a location neighboring saidremodeling pad layer.

According to the first aspect of the present invention, furthermore,there is provided a thin multi-layer circuit board which is obtained byalternately stacking wiring pattern layers and insulating layers on aninsulating plate-like substrate, and electrically interconnecting saidwiring pattern layers through vias in said insulating layers in order to(i.e. construct) a predetermined circuit pattern by said wiring patternlayers, wherein a metallic barrier layer is formed on the wiring patternlayer in an electronic part-mounting region, a barrier metal exclusionzone is included in said metallic barrier layer, and a remodeling padlayer and an electronic part-mounting pad layer are formed on saidmetallic barrier layer, said remodeling pad layer being arranged in alocation neighboring said barrier metal exclusion zone and saidelectronic part-mounting pad layer being arranged in a locationneighboring said remodeling pad layer.

In the process for fabrication of the thin multi-layer circuit boardaccording to the first aspect of the present invention as describedabove, the barrier metal exclusion zone is prepared in a locationneighboring the remodeling pad layer. In using the remodeling pad,therefore, the wiring pattern layer is cut by a YAG laser along thebarrier metal exclusion zone in order to cut the electrical connectionbetween the remodeling pad and the wiring pattern layer. Therefore,destruction of the insulating layer in the thin multi-layer circuitboard is minimized. Moreover, the barrier metal is formed of asufficient thickness making it possible to prevent the barrier metalfrom being corroded at the time of soldering lead wires onto theelectronic part-mounting pad and onto the remodeling pad.

According to a second aspect of the present invention, there is provideda process for fabricating thin multi-layer circuit boards by alternatelystacking wiring pattern layers and insulating layers on an insulatingplate-like substrate, and electrically interconnecting said wiringpattern layers through vias in said insulating layers in order toconstitute a predetermined circuit pattern by said wiring patternlayers, wherein a metallic barrier layer is formed on the wiring patternlayer in an electronic part-mounting region, a pad-forming resist isformed in said metallic barrier layer, a gold pad layer of apredetermined shape is formed on said metallic barrier layer by usingsaid pad-forming resist, and said pad-forming resist is removed.

According to the second aspect of the present invention, there isprovided a process for fabricating thin multi-layer circuit boards byalternately stacking wiring pattern layers and insulating layers on aninsulating plate-like substrate, and electrically connecting said wiringpattern layers through vias in said insulating layers in order toconstitute a predetermined circuit pattern by said wiring patternlayers, wherein a pad-forming resist is formed on the wiring patternlayer in an electronic part-mounting region, a metallic barrier layer isformed on the wiring pattern layer, a gold pad layer of a predeterminedshape is formed on the metallic barrier layer using the pad formingresist, and said pad-forming resist is removed.

In the process for fabrication according to the second aspect of thepresent invention, the gold pad layer is formed into a predeterminedshape by using the pad-forming resist and without the need of using ahighly toxic gold-etching solution, contributing to the safety of theoperation.

According to a third aspect of the present invention, there is provideda process for fabricating thin multi-layer circuit boards by alternatelystacking wiring pattern layers and insulating layers on an insulatingplate-like substrate, and electrically connecting said wiring patternlayers through vias in said insulating layers in order to constitute apredetermined circuit pattern by said wiring pattern layers, wherein thewiring pattern layers are formed on the insulating layers bysequentially forming a first thin chromium film, a copper layer and asecond thin chromium film on said insulating layers followed by etching.

In the process for fabrication according to the third aspect of thepresent invention, the wiring pattern layers on the insulating layersare formed by sequentially forming the first thin chromium film, thecopper layer and the second thin chromium film on the insulating layersfollowed by etching. Therefore, there is no need for employing alift-off method for forming the second thin chromium film on theinsulating layers.

According to a fourth aspect of the present invention, there is provideda process for fabricating thin multi-layer circuit boards by alternatelystacking wiring pattern layers and insulating layers on an insulatingplate-like substrate, and electrically connecting said wiring patternlayers through vias in said insulating layers in order to constitute apredetermined circuit pattern by said wiring pattern layers, wherein ametallic barrier film covers the wiring pattern layer every time awiring pattern layer is formed. The metallic barrier film can be formedby either a lift-off method or an etching method. When each wiringpattern layer is made up of a thin chromium film and a copper layerformed on the thin chromium film, the metallic barrier film covers thecopper layer. When each wiring pattern layer is made up of a first thinchromium film, a copper layer formed on the thin chromium film and asecond thin chromium film formed on the copper layer, the metallicbarrier film covers the second thin chromium film.

In the process for fabrication according to the fourth aspect of thepresent invention, the metallic barrier film covers the wiring patternlayer every time a wiring pattern layer is formed. Therefore, adefective wiring pattern layer can be removed by wet-etching, and theetching solution is prevented from infiltrating into the wiring patternlayers of the lower side. It is therefore possible to form the wiringpattern again after a defective wiring pattern layer is removed,contributing greatly to decreasing the cost of producing the thinmulti-layer circuit board.

According to a fifth aspect of the present invention, there is provideda method of pre-baking a photosensitive polyimide resin layer in aprocess for fabricating thin multi-layer circuit boards by alternatelystacking wiring pattern layers and insulating layers on an insulatingplate-like substrate, and electrically connecting said wiring patternlayers through vias in said insulating layers in order to constitute apredetermined circuit pattern by said wiring pattern layers, wherein aheat-accumulating block is arranged in an atmosphere of a predeterminedtemperature, and said insulating plate-like substrate is placed over theheat-accumulating block close thereto and is heated. Desirably, a gap ofabout 0.3 mm is maintained between the heat-accumulating block and theinsulating plate-like substrate. Desirably, the heat-accumulating blockis constituted by a block member having a flat heating surface, a pairof guide walls that extend in parallel along the opposing side edges ofthe heating surface of the block member, and rail elements that extendalong the corners formed by the pair of guide walls and the heatingsurface, and the pair of guide walls have a lateral width which isslightly larger than a distance between the opposing side edges on oneside of the insulating plate-like substrate.

In the pre-baking method according to the fifth aspect of the presentinvention, the heat-accumulating block is disposed in an atmosphereheated at a predetermined temperature, the insulating plate-likesubstrate is placed over the heat-accumulating block close thereto andis heated. Therefore, the insulating plate-like substrate can beuniformly heated from the back side thereof without being stuck to theheat-accumulating block. With the heat-accumulating block according tothe fifth aspect of the present invention, furthermore, the insulatingplate-like substrate is placed on the rail elements from the ends on oneside of the pair of guide walls and is moved over the flat surface ofthe heat-accumulating block and is pulled out by being placed on therail elements. Therefore, even when a plurality of suchheat-accumulating blocks are arranged to be stacked in an oven, theinsulating plate-like substrates can be easily put into, and pulled outof, the heat-accumulating blocks.

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1 to 16 are diagrams schematically illustrating the steps in aprocess for fabricating thin multi-layer circuit boards according to afirst aspect of the present invention;

FIGS. 17 to 26 are diagrams schematically illustrating the steps in aprocess for fabricating thin multi-layer circuit boards according to asecond aspect of the present invention;

FIGS. 27 to 35 are diagrams schematically illustrating the steps in aprocess for fabricating thin multi-layer circuit boards according to athird aspect of the present invention;

FIG. 36 is a diagram schematically illustrating a step in a process forfabricating thin multi-layer circuit boards according to a fourth aspectof the present invention;

FIGS. 37 to 39 are diagrams schematically illustrating the steps in aprocess for applying a metallic barrier film onto a wiring pattern layerin the thin multi-layer circuit substrate shown in FIG. 36;

FIGS. 40 to 42 are diagrams schematically illustrating the steps inanother process for applying a metallic barrier film onto a wiringpattern layer in the thin multi-layer circuit substrate shown in FIG.36;

FIG. 43 is a diagram which schematically illustrates the principle of apre-baking method according to a fifth aspect of the present invention;

FIG. 44 is a graph showing the distribution of temperature rise of whena ceramic substrate is heated by the pre-baking method shown in FIG. 43;

FIG. 45 is a graph showing the distribution of temperature rise of whena ceramic substrate is heated by a pre-baking method which is differentfrom the pre-baking method shown in FIG. 43;

FIG. 46 is a perspective view of a heat-accumulating block that issuited for putting into practice the pre-baking method according to thefifth aspect of the present invention;

FIG. 47 is a diagram illustrating an end surface of theheat-accumulating block;

FIG. 48 is a graph showing the distribution of temperature rise of whena ceramic substrate is heated by using the heat-accumulating blocks ofFIGS. 46 and 47; and

FIGS. 49 to 72 are diagrams schematically illustrating the steps in aconventional representative process for fabricating thin multi-layercircuit boards.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

Before a detailed explanation of some embodiments of the presentinvention is given, a conventional process for producing a thinmulti-layer circuit board will be described with reference to theaccompanying FIGS. 49 to 72.

Referring, first, to FIG. 49, a thin chromium film 12 is formed on, forexample, a ceramic substrate 10, and a thin copper film 14 is formed onthe thin chromium film 12. The thin chromium film 12 and the thin copperfilm 14 are usually formed by sputtering. Then, in order to form a firstwiring pattern on the thin copper film 14, a copper-plating resist 16 isformed on the thin copper film 14 as shown in FIG. 50. By plating copperon the copper-plating resist 16, a copper-plated layer 18 is formed onthe first wiring pattern as shown in FIG. 51. After the copper-platedlayer is formed, the copper-plating resist 16 is removed as shown inFIG. 52 and, then, a thin chromium film 20 is formed again on the thincopper film 14 and on the copper-plated layer 18 as shown in FIG. 53.Referring next to FIG. 54, an etching resist 22 is formed on the firstwiring pattern. Then, by effecting the etching, the thin copper film 14and the thin chromium film 12 are removed from the regions other thanthe first wiring pattern as shown in FIG. 55. Thereafter, the etchingresist 22 is removed to obtain a first wiring pattern layer 24 on theceramic substrate 10 as shown in FIG. 56. The thin chromium film 12 hasa thickness of, for example, about 0.08μ, the thin chromium film 22 hasa thickness of, for example, about 0.15μ, and copper layers (12, 18)sandwiched between these thin chromium films have a thickness of, forexample, about 5μ.

After the first wiring pattern layer 24 is formed on the ceramicsubstrate 10, an insulating layer such as a photosensitive polyimideresin layer 26 is applied thereon and is pre-baked as shown in FIG. 57.Then, the insulating layer 26 is developed by exposure to light througha predetermined pattern, and whereby a via hole 28 is formed at apredetermined portion of the insulating layer 26 as shown in FIG. 58.After the insulating layer 26 is cured, a thin chromium film 30 and athin copper film 32 are formed thereon by sputtering as shown in FIG.59. Then, in order to form a second wiring pattern on the thin copperfilm 32, a plating resist 34 is formed on the thin copper film 32 asshown in FIG. 60.

By plating copper on the plating resist 34, a copper-plated layer 36 isformed on the second wiring pattern as shown in FIG. 61.

In the region, i.e., in the electronic part-mounting region shown inFIGS. 49 to 61, nickel and gold are further plated on the copper-platedlayer 36 thereby to form a nickel-plated layer 38 and a gold-platedlayer 40. Then, the plating resist 34 is removed as shown in FIG. 62.Referring next to FIG. 63, an etching resist 42 is formed on the secondwiring pattern, followed by etching to remove the thin copper film 32and the thin chromium film 30 from the regions other than the secondwiring pattern as shown in FIG. 64. Thereafter, the etching resist 42 isremoved to obtain a second wiring pattern 44 on the insulating layer 26as shown in FIG. 65. As will be obvious from FIG. 65, the first wiringpattern layer 24 and the second wiring pattern layer 44 are connected toeach other through conducting metals in a via hole, and a predeterminedcircuit pattern is constituted by these two wiring pattern layers 24 and44. The thin chromium film 30 has a thickness of, for example, about0.081μ, the copper layers (32, 36) on the thin chromium film 30 have athickness of, for example, about 4μ, the nickel-plated layer 38 has athickness of, for example, about 3μ, and the gold-plated layer 40 has athickness of, for example, about 0.6μ.

A gold-etching resist 46 is formed in a predetermined pattern on theelectronic part-mounting region, i.e., on the gold-plated layer 40 asshown in FIG. 66, and then gold is removed by etching. As shown in FIG.67, therefore, the gold-plated layer 40 is partly removed and thenickel-plated layer 38 is exposed. Thereafter, the gold-etching resist46 is removed as shown in FIG. 68, and, then, a chromium lift-off resist48 is formed on the insulating layer 26 in order to form a thin chromiumfilm on the second wiring pattern layer 44. In this case, the chromiumlift-off resist 48 is applied onto the gold-plated layer 40, too, asshown in FIG. 69. By effecting the chromium lift-off sputtering, a thinchromium film 50 is formed on the second wiring pattern layer 44 and onthe chromium lift-off resist 48 as shown in FIG. 70. The chromiumlift-off resist 48 is then removed as shown in FIG. 71, and the thinchromium film 50 is left on the second wiring pattern layer 44 only.Then, as shown in FIG. 72, an overcoat insulating layer 52 composed of apolyimide resin is applied onto the insulating layer 26 and onto thesecond wiring pattern layer 44, and the surface of the gold-plated layer40 is exposed to obtain a thin multi-layer circuit board.

In the conventional thin multi-layer circuit board shown in FIG. 72, thegold-plated layer 40 is divided into three exposed pads 40 a, 40 b and40 c. The pad 40 a serves as a part-mounting pad for soldering the leadwires when an electronic part is mounted. The pad 40 b serves as aremodeling pad that is used for remodeling or repairing the circuitwiring, and is used for soldering the lead wires as required forremodeling or repairing the circuit wiring. The pad 40 c is used foronly electrically connecting the part-mounting pad 40 a and theremodeling pad 40 b to the wiring pattern layers 24 and 44. Dependingupon the cases, the pad 40 c may be covered with the overcoat insulatinglayer 52.

In the above-mentioned thin multi-layer circuit board, the nickel-platedlayer 38 works as a metallic barrier layer for protecting the copperlayers (32, 36) when a lead wire is soldered onto the part-mounting pad40 a and/or the remodeling pad 40 b. If described in detail, when thereis no nickel-plated layer 38, the solder material permeates into thecopper layers (32, 36) at the time of soldering, causing the electricproperties and mechanical properties to change. In order to prevent thesolder material from permeating into the copper layers (32, 36),therefore, the nickel-plated layer 38 is necessary. The nickel-platedlayer 38 must have a thickness of at least 3μ so that it works as ametallic barrier layer to a sufficient degree. When the thickness issmaller than 3μ, the nickel-plated layer 38 corrodes at the time ofsoldering, causing a problem in that the solder material permeates intothe copper layers (32, 36).

In the conventional thin multi-layer circuit board, however, thepresence of a metallic barrier layer, i.e., the nickel-plated layer 38,becomes a problem at the time of remodeling or repairing the circuitwiring. That is, to remodel or repair the circuit wiring, the electricalconnection between the remodeling pad 40 b and the wiring pattern layers24, 44 must be cut off. This is done by cutting the conductor layerbetween the remodeling pad 40 b and the pad 40 c by using a YAG laserbeam. Here, however, a problem arises that the nickel-plated layer 38cannot be desirablly cut by the YAG laser beam. In particular, itbecomes difficult to cut the nickel-plated layer 38 when its thicknessexceeds 3μ. The nickel-plated layer 38 can be cut by increasing theoutput of the YAG laser beam but this causes the insulating layer 26 tobe damaged to a large extent. It is not, therefore, possible to increasethe output of the YAG laser beam. The thickness of the nickel-platedlayer 38 can be decreased so that it can be easily cut by the YAG laserbeam but this is accompanied by the problem of corrosion at the time ofsoldering.

Moreover, it has been pointed out that the conventional process forproducing thin multi-layer circuit boards involves the processing foretching the gold-plated layer 40 (FIGS. 66 and 67). That is, theprocessing for etching the gold-plated layer 40 requires a stronglytoxic solvent, and it is desirable to exclude such an etching processingfrom the steps of producing thin multi-layer circuit boards.

It has further been pointed out that the conventional process forproducing thin multi-layer circuit boards employs a lift-off method forforming the thin chromium film 50 on the second wiring pattern layer 44(FIGS. 69, 70, 71), which is another problem. That is, after the thinchromium film 50 is formed, it is not easy to remove the lift-off resist48 and a relatively long period of time is required for the removalstep.

In the conventional process for producing thin multi-layer circuitboards, furthermore, there is a problem in sequentially stacking anumber of wiring pattern layers on the ceramic substrate. In detail,when ten wiring pattern layers, for instance, are stacked on the ceramicsubstrate, up to nine wiring pattern layers can be properly formed butthe tenth wiring pattern layer may be broken or short-circuited. If thishappens, the device must be discarded as a defective product. Attemptshave been made to remove the defective wiring pattern layer bywet-etching and to form the wiring pattern again but this permits theetching solution to infiltrate into the lower wiring pattern layersthrough the via. Therefore, the lower wiring pattern layers are damaged,and this makes it difficult to form the wiring pattern layer again.

A further problem in the conventional process for producing thinmulti-layer circuit boards resides in the pre-baking of thephotosensitive polyimide resin. In detail, the photosensitive polyimideresin is used not only as an insulating material but also as aphotoresist material at the time of forming a metal-plated layer. Thepolyimide resin is pre-baked when it is applied in the process forproducing thin multi-layer circuit boards. Here, “pre-baking” meansvaporizing the solvent by leaving the polyimide resin in an atmosphereheated to a temperature of about 80° C. In this case, it is desirable touniformly heat the ceramic substrate from the back side thereof. Thus,via holes and the like are formed with a high resolution in thepolyimide resin layer by exposure to light and development. That is, viaholes and the like can be formed accurately. For this purpose, aheat-accumulating block made of a material having excellentheat-accumulating property was placed in an oven and a ceramic substratewas placed on the heat-accumulating block in order to uniformly heat theceramic substrate from the back side thereof. This resulted in failurebecause, although the ceramic substrate is uniformly heated, thepolyimide resin that reached the back surface of the ceramic substratewhen the polyimide resin was applied causes the ceramic substrate tostick onto the heat-accumulating block hindering the workability to agreat extent.

Thus, in order to solve the above-mentioned problems and attain theobjects of the present invention discussed hereinbefore, someembodiments of the first through fifth aspects of the present inventionwill be presented.

An embodiment of a process for fabricating thin multi-layer circuitboards according to a first aspect of the present invention will now bedescribed with reference to FIGS. 1 to 17 of the accompanying drawings.The initial steps in the fabrication process according to the firstaspect of the present invention are substantially the same as those ofthe conventional fabrication process described earlier, and are notmentioned again.

FIG. 1 illustrates a state where a first wiring pattern layer 24 isformed on a ceramic substrate 10, an insulating layer such as aphotosensitive polyimide resin layer 26 is applied onto the first wiringpattern layer 24 and after being pre-baked a via hole 28 is formed and,then, after the insulating layer 26 is cured, a thin chromium film 30and a thin copper film 32 are formed by, for example, sputtering. On thethin copper film 32 is formed a copper-plating resist 54 for forming asecond wiring pattern as shown in FIG. 1. When copper is plated on thecopper-plating resist 54, a copper-plated layer 56 is formed on thesecond wiring pattern as shown in FIG. 2 and, thereafter, thecopper-plating resist 54 is removed as shown in FIG. 3.

The diagramed region is an electronic part-mounting region. In thisregion, nickel and gold are further plated on the copper-plated layer56. For this purpose, a plating resist 58 is formed as shown in FIG. 4.In this case, a plating resist 58 a, too, is formed on the copper-platedlayer 56 to prepare a nickel exclusion zone on a portion thereof. Afterthe plating resist is formed, nickel is plated to form a nickel-platedlayer 60 as shown in FIG. 5 and, then, gold is plated on thenickel-plated layer 60 to form a gold-plated layer 62. After theplating, the plating resist is removed as shown in FIG. 6. In this case,a zone on a part of the surface of the copper-plated layer 56, i.e., thezone to which the plating resist 58 a is applied turns into a nickelexclusion zone.

After the plating resist is removed, an etching resist 64 is formed onthe second wiring pattern as shown in FIG. 7. By effecting the etchingthereto, the thin copper film 32 and the thin chromium film 30 areremoved from the regions other than the second wiring pattern as shownin FIG. 8. Then, the etching resist 64 is removed to obtain a secondwiring pattern layer 66 on the insulating layer 26 as shown in FIG. 9.As will be obvious from FIG. 9, the first wiring pattern layer 24 andthe second wiring pattern layer 66 are electrically connected togetherby conducting metals in the via hole, and whereby a predeterminedcircuit pattern is constituted by these two wiring pattern layers 24 and66.

On the gold-plated layer 62 is formed a gold-etching resist 68 in apredetermined pattern as shown in FIG. 10 and, then, gold is etched. Asa result, the gold-plated layer 62 is partly removed as shown in FIG.11, and is divided into three pad layers. After, the gold-etching resist68 is removed as shown in FIG. 12, the three gold-plated layers, whichare the pad layers, serve as an electronic part-mounting pad 62 a, as aremodeling pad 62 b and as a connection pad 62 c. Then, a chromiumlift-off resist 70 is formed on the insulating layer 26 as shown in FIG.13 in order to form a thin chromium film on the second wiring patternlayer 66 and, at this time, the chromium lift-off resist 70 is alsoformed on the electronic part-mounting pad 62 a and on the remodelingpad 62 b. After the chromium lift-off sputtering is effected, a thinchromium film 72 is formed on the second wiring pattern layer 66 and onthe chromium lift-off resist 70 as shown in FIG. 14. Then, the chromiumlift-off resist 70 is removed as shown in FIG. 15, and the thin chromiumfilm 72 is left on the second wiring pattern layer 66 only. Then, asshown in FIG. 16, an overcoat insulating layer 74 composed of apolyimide resin is applied onto the insulating layer 26 and onto thesecond wiring pattern layer 66 while exposing the electronicpart-mounting pad 62 a and the remodeling pad 62 b through the overcoatinsulating layer 74.

When the remodeling pad 62 b is used for remodeling or repairing thecircuit wiring in the thus fabricated thin multi-layer circuit board,the electric connection between the remodeling pad 62 b and the secondwiring pattern layer can be easily cut off by a low output YAG laser ora similar laser. This is because the nickel exclusion zone, denoted byreference numeral 76, is used as a portion to be cut. According to thefirst aspect of the present invention, furthermore, the nickel-platedlayer 60 can be formed maintaining a thickness of not smaller than 3μand, preferably, maintaining a thickness of about 3.5μ, contributing tothe corrosion resistance of the nickel-plated layer 60 when solderinglead wires to the electronic part-mounting pad 62 a and to theremodeling pad 62 b occurs.

FIGS. 17 to 27 illustrate an embodiment of the process for fabricatingthin multi-layer circuit boards according to a second aspect of thepresent invention. The initial steps in this fabrication process aresubstantially the same as those of the fabrication process according tothe first aspect of the present invention. That is, a first wiringpattern layer 24 is formed on a ceramic substrate 10, a photosensitivepolyimide resin layer 26 is applied onto the first wiring pattern layer24 and after pre-baked a via hole 28 is formed, and, then, after theinsulating layer 26 is cured, a thin chromium film 30 and a thin copperfilm 32 are formed by, for example, sputtering, and a copper-platinglayer 56 is formed on the thin copper film 32 in order to form a secondwiring pattern, which is the same as the fabrication process accordingto the first aspect of the present invention.

After the copper-plated layer 56 is formed, nickel and gold are furtherplated on the copper-plated layer 56 in the electronic part-mountingregion. For this purpose, a plating resist 78 is formed around theelectronic part-mounting region as shown in FIG. 17, and on the insidethereof are formed plating resists 78 a and 78 b on the copper-platedlayer 56. After the plating resist is formed, nickel is plated to form anickel-plated layer 80 as shown in FIG. 18 and, then, gold is plated onthe nickel-plated layer 80 to form a gold-plated layer 82. Thereafter,the plating resist is removed as shown in FIG. 19.

Referring to FIG. 20, after the plating resist is removed, an etchingresist 84 is formed on the second wiring pattern and, then, etching iseffected to remove the thin copper film 32 and the thin chromium film 30from the regions other than the second wiring pattern as shown in FIG.21. Then, the etching resist 84 is removed to obtain a second wiringpattern layer 86 on the insulating layer 26 as shown in FIG. 22. Here,it should be noted that the nickel-plated layer 80 and the gold-platedlayer 82 have, respectively, been divided into three by the platingresists 78 a and 78 b at the time of plating, and the dividedgold-plated layer serves as the electronic part-mounting pad 82 a, asthe remodeling pad 82 b and as the connection pad 82 c, eliminating theneed of etching the gold-plated layer 80.

Thereafter, a chromium lift-off resist 88 is formed on the insulatinglayer 26, as shown in FIG. 23 to form a thin chromium layer on thesecond wiring pattern layer 86 and, at this time, the chromium lift-offresist 88 is also formed on the electronic part-mounting pad 82 a and onthe remodeling pad 82 b. After chromium lift-off sputtering is effected,a thin chromium film 90 is formed on the second wiring pattern layer 86and on the chromium lift-off resist 88 as shown in FIG. 24. Then, as thechromium lift-off resist 88 is removed as shown in FIG. 25, the thinchromium film 90 is left on the second wiring pattern layer 86 only.Thereafter as shown in FIG. 26, an overcoat insulating layer 92 composedof a polyimide resin is applied onto the insulating layer 26 and ontothe second wiring pattern layer 86 while the electronic part-mountingpad 82 a and the remodeling pad 82 b are exposed through the overcoatinsulating layer 92.

The aforementioned fabrication process has a feature in that there is noneed to effect the etching for the gold-plated layer 82 and, hence, theuse of a highly toxic etching solution can be avoided. According to thisembodiment, furthermore, the remodeling pad 82 b is disposed neighboringthe nickel exclusion region and, hence, the electrical connectionbetween the remodeling pad 62 b and the second wiring pattern layer 86can be easily cut by a low output YAG laser or the like at the time ofremodeling or repairing the circuit wiring as in first aspect of thepresent invention. In the fabrication method according to the secondaspect of the present invention, i.e., in the fabrication which excludesthe gold-etching processing, however, the nickel-plated layer 80 may beextended without being divided. In this case, after the nickel-platedlayer is formed in an extending manner, plating resists (78 a, 78 b) asshown in FIG. 17 are formed on the nickel-plated layer in the electronicpart-mounting region.

FIGS. 27 to 36 illustrate an embodiment of the process for fabricatingthin multi-layer circuit boards according to a third aspect of thepresent invention. The initial steps in this fabrication process aresubstantially the same as those of the fabrication process according tothe first aspect of the present invention. That is, a first wiringpattern layer 24 is formed on a ceramic substrate 10, a photosensitivepolyimide resin layer 26 is applied onto the first wiring pattern layer24 and is pre-baked to form a via hole 28, and, then, after theinsulating layer 26 is cured, a thin chromium film 30 and a thin copperfilm 32 are formed by, for example, sputtering, and a copper-platinglayer 56 is formed on the thin copper film 32 in order to form a secondwiring pattern, which are the same as in the fabrication processaccording to the first aspect of the present invention.

After the copper-plated layer 56 is formed as shown in FIG. 27, a thinchromium film 94 is formed by, for example, sputtering on the thincopper film 32 and on the copper-plated layer 56. After the thinchromium film 94 is formed, a resist 96 is formed around the electronicpart-mounting region as shown in FIG. 28 and, besides, resists 96 a and96 b are formed on the thin chromium film 94 on the inside of theelectronic part-mounting region. After the resist is formed, the etchingis effected to remove the thin chromium film 94 from the electronicpart-mounting region as shown in FIG. 29. Then, in the electronicpart-mounting region, a nickel-plated layer 98 is formed as shown inFIG. 30. Thereafter, a gold-plated layer 100 is formed by plating goldon the nickel-plated layer 98 and, then, plating resists 96, 96 a and 96b are removed as shown in FIG. 31.

After the plating resists are removed, an etching resist 102 is formedon the second wiring pattern as shown in FIG. 32. By effecting theetching thereto, the thin chromium film 94, the thin copper film 32 andthe thin chromium film 30 are removed from the regions other than thesecond wiring pattern as shown in FIG. 33. Thereafter, the etchingresist 102 is removed to obtain a second wiring pattern layer 104 on theinsulating layer 26 as shown in FIG. 34. As the case of the embodiment(FIGS. 17 to 26) according to the second aspect of the presentinvention, the nickel-plated layer 98 and the gold-plated layer 100 are,respectively, divided into three by the plating resists 96 a and 96 b atthe time of plating, and the divided gold-plated layers serve as anelectronic part-mounting pad 100 a, as a remodeling pad 100 b and as aconnection pad 100 c, eliminating the need of effecting the etching forthe gold-plated layer 100. Then, as shown in FIG. 35, an overcoatinsulating layer 106 composed of a polyimide resin is applied onto theinsulating layer 26 and onto the second wiring pattern layer 104 whileexposing the electronic part-mounting pad 100 a and the remodeling pad100 b through the overcoat insulating layer 92.

The aforementioned fabrication process has a novel feature in that thethin chromium film 94 is formed on the second wiring pattern layer 104formed on the insulating layer 26 without relying upon the lift-offmethod. This embodiment has not only the feature according to the firstaspect of the present invention in that the electrical connectionbetween the remodeling pad 100 b and the second wiring pattern layer 104is easily cut by a low output YAG laser or the like at the time ofremodeling or repairing the circuit wiring but also the feature,according to the second aspect of the present invention, that there isno need to etch the gold-plated layer 100. In addition, it should beunderstood that the feature according to the third aspect of the presentinvention, i.e., forming the thin chromium film on the insulating layerwithout relying upon the lift-off method, by itself constitutes aninvention.

FIG. 36 illustrates, in the form of an intermediate product, a thinmulti-layer circuit board fabricated by the process for fabricationaccording to a fourth aspect of the present invention. This intermediateproduct is in a stage in which wiring pattern layers and polyimide resinlayers are alternately stacked on a ceramic substrate 108. That is, onthe ceramic substrate 108 is formed a first wiring pattern layer 110which is covered with a first polyimide resin insulating layer 112. Onthe first polyimide resin insulating layer 112 is formed a second wiringpattern layer 114 which is covered with a second polyimide resininsulating layer 116. On the second polyimide resin insulating layer 116is formed a third wiring pattern layer 118 which is covered with a thirdpolyimide resin insulating layer 120. The first to third wiring patternlayers 110, 114 and 118 are connected together through vias formed inthe polyimide resin insulating layers 112, 116 and 120, thereby toconstitute a predetermined circuit pattern. The wiring patterns 110, 114and 118, respectively, include thin chromium films 110 a; 11 b, 114 a;114 b, 118 a; 118 b, as well as copper layers 110 c, 114 c and 118 cformed among the thin chromium films. The wiring pattern layers 110,114, 118 and the polyimide resin insulating layers 112, 116, 118 can beformed through a variety of processes mentioned already.

In this embodiment, the thin chromium films 110 b, 114 b and 118 b arecovered with a metallic barrier film 122 every time the wiring patternlayers 110, 114 and 118 are formed, the metallic barrier film 122 beingcomprised of, for example, titanium nitride, platinum or the like. Themetallic barrier film 122 can be incorporated at the time of forming thewiring pattern layers 110, 114 and 118 relying, for example, upon theetching as shown in FIGS. 37 to 39. Referring to FIG. 37, a first thinchromium film 110 a is, first, formed by sputtering on the ceramicsubstrate 108 and, then, copper is sputtered thereon. Next, a copperlayer 110 c is formed by plating copper on a region that corresponds tothe first wiring pattern, then, a second thin chromium film 110 b isformed by sputtering and a metallic barrier film 122 is formed thereonby sputtering. Referring next to FIG. 38, an etching resist 124 isformed on a predetermined region and the etching is effected to obtain afirst wiring pattern layer 110 as shown in FIG. 39. The metallic barrierfilm 122 of titanium nitride or platinum is very stable against anetching solution for chromium or copper. When the metallic barrier film122 is composed of titanium nitride, therefore, the etching solutionwill comprise concentrated hydrofluoric acid, concentrated nitric acidand water. When the metallic barrier film 122 is composed of platinum,the etching solution will be aqua regia or a diluted aqua regiasolution.

As shown in FIGS. 40 to 42, furthermore, the metallic barrier film canalso be formed by the lift-off method. That is, a first thin chromiumfilm 110 a is formed by sputtering on the ceramic substrate 108 and,then, copper is sputtered thereon. Next, a copper layer 110 c is formedby plating copper on a region corresponding to the first wiring pattern,and the first thin chromium film 110 a and the copper layer 110 c areformed into a predetermined wiring pattern by etching. Then, a lift-offresist 126 is formed thereon as shown in FIG. 40. Referring next to FIG.42, a thin chromium film 110 b and a metallic barrier film 122 areformed by sputtering. Then, the lift-off resist 126 is removed to obtaina first wiring pattern layer 110 on the ceramic substrate 120.

In the process for fabrication according to the fourth aspect of thepresent invention, a defective wiring pattern layer that is formed inthe step of alternately stacking the wiring pattern layers and thepolyimide resin insulating layers, can be formed again. For instance, incase a defect is found after the third wiring pattern layer 118 isformed, the third wiring pattern layer 118 is removed without at alldamaging the second wiring pattern layer 116. In detail, the metallicbarrier film 122 of the third wiring pattern layer 118 is removed byusing the above-mentioned etching solution and, then, the second thinchromium film 118 b, copper layer 118 c and first thin chromium film 118a are removed by using a known etching solution. In this case, thesecond wiring pattern layer 114 has been covered with the metallicbarrier film 122, and the etching solution for chromium and copper doesnot permeate into the second wiring pattern layer 114 through the via.Accordingly, the third wiring pattern layer 118 that has been removedcan be formed again.

In the embodiment according to the fourth aspect of the presentinvention, the metallic barrier film 122 covers the second thin chromiumfilms 110 b, 114 b and 118 b of the wiring pattern layers 110, 114 and118. As required, the metallic barrier film 122 may be formed betweenthe copper layers 110 c, 114 b, 118 b and the second thin chromium films110 b, 114 b, 118 b. In this case, the second thin chromium films 110 b,114 b and 118 b may be damaged at the time of removing the defectingwiring pattern layer, but the damage does not extend to the copperlayers 110 c, 114 b and 118 b. By strictly managing the etching time,furthermore, damage to the second thin chromium films can be minimized.

In the process for fabricating thin multi-layer circuit boards asdescribed above, the photosensitive polyimide resin is used not only asan insulating material but also as a resist material. When the polyimideresin is applied, the ceramic substrate is put into the oven and ispre-baked. It was mentioned already that in this case, the ceramicsubstrate is uniformly heated from the back side thereof. A fifth aspectof the present invention is directed to improving the pre-baking method.

FIG. 43 illustrates the principle of the pre-baking method according tothe fifth aspect of the present invention, wherein reference numeral 128denotes a heat-accumulating block which is made of, for example,aluminum. The heat-accumulating block 128 is left to stand in an oven(not shown) having an atmospheric temperature of, for example, about 80°C. The heat-accumulating block 128 has a flat upper surface, and a pairof copper strips 130 are disposed along the opposing side edges on thesurface thereof. A ceramic substrate 132 coated with the polyimide resinis placed on the pair of copper strips 130, and a gap of about 0.3 mm ismaintained between the upper surface of the heat-accumulating block 128and the ceramic substrate 132. Therefore, the ceramic substrate 132 isgradually heated from the back side thereof by receiving radiant heat.At this moment, the rise in the temperature is measured at five pointsat equal distances along the diagonal of the ceramic substrate 132. Theresults are shown in a graph of FIG. 44 from which it will be obviousthat the temperature rises are nearly the same at all of theabove-mentioned five points. FIG. 45 illustrates similar temperaturerises in the case when the ceramic substrate 132 is placed on the uppersurface of the heat-accumulating block. It can be regarded that thetemperature rise is substantially the same at five points maintaining anequal distance along the diagonal lines of the ceramic substrate 132.That is, it is desired to place the ceramic substrate 132 directly onthe upper surface of the heat-accumulating block in order to uniformlyheat the ceramic substrate 132. As mentioned earlier, however, it is notpossible to place the ceramic substrate 132 directly on theheat-accumulating block 128.

FIGS. 46 and 47 illustrate a heat-accumulating block 134 adapted toputting the pre-baking method of the present invention into practice.The heat-accumulating block 134 comprises a block member 138 having aflat heating surface 136, a pair of guide walls 140 that extend inparallel along the opposing sides of the heating surface 136 of theblock member 138, and rail elements 142 that extend along the cornersformed by the guide walls 140 and the heating surface 136. The lateralwidth of the pair of guide wall portions 140 is slightly broader thanthe distance between the opposing side edges of the insulatingplate-like substrate. With this constitution, the ceramic substrate 132is placed on the rail elements 142 from the ends on one side of the pairof guide walls 140, and is pushed; i.e., the ceramic substrate 132 canbe easily moved on the flat surface 136 of the heat-accumulating block134 and can be easily pulled out along the rail elements 142. Even whena plurality of heat-accumulating blocks 134 are arranged in a pluralityof stages to be stacked in the up-and-down direction in the oven, theceramic substrates can be easily put into, and taken out from, theheat-accumulating blocks 134, enabling the pre-baking processing to bequickly executed.

FIG. 48 is a graph showing the results of the measurement of thetemperature rise distribution in the manner described above in the casewhen the ceramic substrate 132 is heated by being placed on theheat-accumulating block 134. It will be obvious from this graph that theceramic substrate 132 is heated substantially uniformly though thetemperature rise distribution is slightly disturbed immediately afterthe start of the heating.

What is claimed is:
 1. A thin multi-layer circuit board which isobtained by alternately stacking wiring pattern layers, including a topwiring pattern layer and insulating layers on an insulating plate-likesubstrate; wherein said wiring pattern layers are electrically connectedthrough vias in said insulating layers in order to constitute apredetermined circuit pattern by said wiring pattern layers; wherein ametallic barrier layer is formed on an exposed portion of said topwiring pattern layer so as to partially cover said top wiring patternlayer in an electronic part-mounting region, a barrier metal exclusionzone is included in said metallic barrier layer, said barrier metalexclusion zone being a part of said metallic barrier layer which doesnot cover said exposed portion of said top wiring pattern layer and aremodeling pad layer, an electronic part-mounting pad layer formed onsaid metallic barrier layer, said remodeling pad layer being arrangedneighboring said barrier metal exclusion zone and said electronicpart-mounting pad layer being arranged neighboring said remodeling padlayer, and wherein said metallic barrier layer is formed such that abarrier metal exclusion zone is at a first location, between the alignedvias in said insulating layers and a second location of the remodelingpad layer, wherein said barrier metal exclusion zone is a part of saidmetallic barrier layer which does not cover said exposed portion of saidwiring pattern layer.
 2. The thin multi-layer circuit board according toclaim 1, wherein said metallic barrier layer having said barrier metalexclusion zone further comprises: a plating resist in a configuration ona lower wiring pattern layer of said wiring pattern layers at a positioncorresponding to said barrier metal exclusion zone; and a nickel layeron said lower wiring pattern layer, the plating resist layer preventingthe formation of nickel on said barrier metal exclusion zone.
 3. A thinmulti-layer circuit board which is obtained by alternately stackingwiring pattern layers, including a top wiring pattern layer andinsulating layers on an insulating plate-like substrate; wherein saidwiring pattern layers are electrically connected through vias in saidinsulating layers in order to constitute a predetermined circuit patternby said wiring pattern layers; wherein a metallic barrier layer isformed on an exposed portion of said top wiring pattern layer so as topartially cover said top wiring pattern layer in an electronicpart-mounting region, a barrier metal exclusion zone is included in saidmetallic barrier layer, said barrier metal exclusion zone being a partof said metallic barrier layer which does not cover said exposed portionof said top wiring pattern layer and a remodeling pad layer, anelectronic part-mounting pad layer formed on said metallic barrierlayer, said remodeling pad layer being arranged neighboring said barriermetal exclusion zone and said electronic part-mounting pad layer beingarranged neighboring said remodeling pad layer, wherein said metallicbarrier layer is formed such that a barrier metal exclusion zone is at afirst location, between the aligned vias in said insulating layers and asecond location of the remodelling pad layer, wherein said barrier metalexclusion zone exists at said locations thereof covered by apad-defining resist layer.
 4. The thin multi-layer circuit boardaccording to claim 3, wherein said metallic barrier layer having saidbarrier metal exclusion zone further comprises: a plating resist in aconfiguration on a lower wiring pattern layer of said wiring patternlayers at a position corresponding to said barrier metal exclusion zone;and a nickel layer on said lower wiring pattern layer, the platingresist layer preventing the formation of nickel on said barrier metalexclusion zone.